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AbstractAbstract
[en] BiSI belongs to the A"VB"V"IC"V"I"I chalcohalides group of compounds. These compounds show several interesting properties such as ferroelectricity, piezoelectricity along the c axis, and photoconductivity. Moreover, BiSI is a potential semiconductor material for room-temperature gamma and x-ray detection, given its band gap of 1.57 eV and its high density, 6.41 g cm"−"3. In this work we present BiSI nanostructures synthesized by the solvothermal method with the intention of using them for ionizing radiation detection. The solvent was varied to study its influence in morphology, particle size and size distribution. Three different conditions were tested, using either water, monoethylene glycol and a mixture of both solvents. Nanostructures were characterized by XRD to determine the phase obtained and reaction completeness; TEM was used to observe nanostructures morphology, size, size distribution and crystallinity; and finally FT-IR diffuse reflectance was used to study monoethylene glycol presence in the samples. Nanorods in the range of 100–200 nm width were obtained in all samples, but round nanoparticles of around 10 nm in diameter were also detected in samples synthesized only with monoethylene glycol. Samples synthesized in monoethylene glycol were used to fabricate pellets to construct detectors. The detectors responded to ionizing radiation and a resistivity in the order of 10"1"3 Ω cm was estimated. This work proposes, to our knowledge, the first study of BiSI for its application in ionizing radiation detection. (paper)
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Source
Available from http://dx.doi.org/10.1088/2053-1591/3/2/025012; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Materials Research Express (Online); ISSN 2053-1591;
; v. 3(2); [8 p.]

Country of publication
FOURIER TRANSFORMATION, INFRARED SPECTRA, IONIZING RADIATIONS, MIXTURES, NANOPARTICLES, NANOSTRUCTURES, PARTICLE SIZE, PHOTOCONDUCTIVITY, PIEZOELECTRICITY, RADIATION DETECTORS, SEMICONDUCTOR MATERIALS, SYNTHESIS, TEMPERATURE RANGE 0273-0400 K, TRANSMISSION ELECTRON MICROSCOPY, WATER, X-RAY DETECTION, X-RAY DIFFRACTION
COHERENT SCATTERING, DETECTION, DIFFRACTION, DISPERSIONS, ELECTRIC CONDUCTIVITY, ELECTRICAL PROPERTIES, ELECTRICITY, ELECTRON MICROSCOPY, HYDROGEN COMPOUNDS, INTEGRAL TRANSFORMATIONS, MATERIALS, MEASURING INSTRUMENTS, MICROSCOPY, OXYGEN COMPOUNDS, PARTICLES, PHYSICAL PROPERTIES, RADIATION DETECTION, RADIATIONS, SCATTERING, SIZE, SPECTRA, TEMPERATURE RANGE, TRANSFORMATIONS
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