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Mi, Jinhua; Li, Yan-Feng; Yang, Yuan-Jian; Peng, Weiwen; Huang, Hong-Zhong, E-mail: hzhuang@uestc.edu.cn2016
AbstractAbstract
[en] The appearance of macro-engineering and mega-project have led to the increasing complexity of modern electromechanical systems (EMSs). The complexity of the system structure and failure mechanism makes it more difficult for reliability assessment of these systems. Uncertainty, dynamic and nonlinearity characteristics always exist in engineering systems due to the complexity introduced by the changing environments, lack of data and random interference. This paper presents a comprehensive study on the reliability assessment of complex systems. In view of the dynamic characteristics within the system, it makes use of the advantages of the dynamic fault tree (DFT) for characterizing system behaviors. The lifetime of system units can be expressed as bounded closed intervals by incorporating field failures, test data and design expertize. Then the coefficient of variation (COV) method is employed to estimate the parameters of life distributions. An extended probability-box (P-Box) is proposed to convey the present of epistemic uncertainty induced by the incomplete information about the data. By mapping the DFT into an equivalent Bayesian network (BN), relevant reliability parameters and indexes have been calculated. Furthermore, the Monte Carlo (MC) simulation method is utilized to compute the DFT model with consideration of system replacement policy. The results show that this integrated approach is more flexible and effective for assessing the reliability of complex dynamic systems. - Highlights: • A comprehensive study on the reliability assessment of complex system is presented. • An extended probability-box is proposed to convey the present of epistemic uncertainty. • The dynamic fault tree model is built. • Bayesian network and Monte Carlo simulation methods are used. • The reliability assessment of a complex electromechanical system is performed.
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S0951-8320(16)00044-2; Available from http://dx.doi.org/10.1016/j.ress.2016.02.003; Copyright (c) 2016 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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