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AbstractAbstract
[en] Proton induced K-shell ionization cross sections were obtained for the elements Al, Si, Ti, Fe, and Ni in the 0.7–2.0 MeV energy range. The accuracy of these fundamental parameters is essential for PIXE analysis and the data in the literature present a considerable spread, mainly for Al and Si. The values obtained for Ti, Fe and Ni are compatible with the current theories and the experimental results reported in the literature. However, Al and Si cross sections present important differences from theoretical and experimental data. We propose values for the fluorescent yields of Al and Si that are compatible with recent results and can be incorporated in the computations of K X-ray production cross sections.
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IBMM 2014: 19. international conference on ion beam modification of materials; Leuven (Belgium); 14-19 Sep 2014; S0168-583X(15)00646-1; Available from http://dx.doi.org/10.1016/j.nimb.2015.07.068; Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
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Journal Article
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Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; ISSN 0168-583X;
; CODEN NIMBEU; v. 365(Part A); p. 8-12

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BARYONS, CHEMICAL ANALYSIS, ELECTROMAGNETIC RADIATION, ELECTRONIC STRUCTURE, ELEMENTARY PARTICLES, ELEMENTS, EMISSION, ENERGY RANGE, FERMIONS, HADRONS, IONIZING RADIATIONS, LUMINESCENCE, METALS, MEV RANGE, NONDESTRUCTIVE ANALYSIS, NUCLEONS, PHOTON EMISSION, RADIATIONS, SEMIMETALS, TRANSITION ELEMENTS, X-RAY EMISSION ANALYSIS
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