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[en] Negative muons are important probes that enable us to investigate non-destructively the elemental composition in thick-layered samples. This method has already shown successful results for the elemental analysis of cultural heritage artifacts. Now, its success attracts also the interest of industrial device developers who want to know non-destructively the inside of a device during switch-on state. At J-PARC MUSE, in response to such needs, we have developed an analysis system with higher detection efficiency to increase opportunities for analyzing many new device samples. This report describes the chamber design and the results obtained from a first test experiment. (author)
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Physical Society of Japan, Tokyo (Japan); 1360 p; ISBN 978-4-89027-112-2; 
; Sep 2015; p. 036016.1-036016.6; 2. international symposium on science at J-PARC; Tsukuba, Ibaraki (Japan); 12-15 Jul 2014; Available from http://dx.doi.org/10.7566/JPSCP.8.036016; 3 refs., 4 figs.
; Sep 2015; p. 036016.1-036016.6; 2. international symposium on science at J-PARC; Tsukuba, Ibaraki (Japan); 12-15 Jul 2014; Available from http://dx.doi.org/10.7566/JPSCP.8.036016; 3 refs., 4 figs.