[en] The paper focuses on evaluating the depositions and support materials used in radiation detectors, by microstructure characterization techniques. Boron depositions on aluminium surface and colloidal graphite deposition on polyethylene support were experimentally obtained. Advanced examination techniques, such as Scanning Electron Microscopy (SEM) and Energy Dispersive X-Ray Spectrometry (EDS) were used for investigations. Because boron cannot be detected by EDS, its deposition was investigated using backscattered electron signals in SEM. The adherence, compactness, chemical composition and content of impurities are the main characteristics of graphite deposition used in radiation detectors. In order to obtain an accurate detection for all deposition types, the impurities content from the depositions has to be small. As result, the examined boron deposition, which was not dense, presented un-connected, non-adherent crystals with different shapes and sizes. The graphite deposition has proven to be adherent, continuous, compact, but not uniform in terms of thickness. (authors)