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AbstractAbstract
[en] In/Si(111) superstructures formed by the deposition of indium on a √3 × √3-In surface at room temperature were investigated by using a scanning tunneling microscope (STM). The 2×2, ‘striped’, hexagonal √7×√3 (√7×√3-hex), and rectangular √7×√3 (√7×√3-rec) structures were identified. We demonstrated that the ‘striped’ and the √7 × √ √ 3-hex structures were falsely identified as 7 × √3-hex and √7 × √3-rec in a previous report [A. A. Saranin et al., Phys. Rev. B 74, 035436 (2006)]. As in the √7 × √3-hex and √7 × √3-rec structures, a √7 × √3 periodicity was observed in the resolved STM features of the ‘striped’ structure. These three √7 × √3 structures formed at room temperature were shown to be identical to the corresponding In-induced phases formed at high temperature. The apparent height difference between the ‘striped’ and the √7 × √3-hex structures in the topographic STM image suggests that the √7×√3-hex structure consists of double layers of In. This possibility contrasts with recent theoretical predictions of single-layer In for the √7 × √3-hex structure.
Source
15 refs, 4 figs
Record Type
Journal Article
Journal
Journal of the Korean Physical Society; ISSN 0374-4884;
; v. 67(7); p. 1192-1196

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