[en] Most of the rotating or noting patterns are being developed by using silver plating through chemical coating. Silver layers deteriorate with the passage of time and become less reflective while undergo through cleaning process due to its softness and the results become unpredictable. In this paper an alternate method for development of above mentioned pattern has been demonstrated. Chromium (Cr) and Silver (Ag) thin films of 200 nm and 160 nm thick respectively have been realized using electron beam evaporation (PVD technique) on quartz substrate. Structural analysis has been carried out by XRD and SEM while optical transmission/reflection has been studied using spectrophotometer. XRD analysis shows that Ag coated thin films exhibit FCC structure while Cr coated thin films reveals a BCC structure. SEM analysis shows almost smooth and uniform surfaces in both cases. After passing through high and low temperature cycles it was found that the results of pattern structures developed by chromium coating were more reliable than obtained through silver platting process. (paper)