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AbstractAbstract
[en] Ga2−x Snx O3 thin films on m-plane (300) sapphire substrates were deposited by laser molecular beam epitaxy technology. Corundum-structured α -phase Ga2−x Snx O3 thin films with different Sn content were obtained at 850 °C in vacuum pressure of 5 × 10−5 Pa. The band-gap energy of the α -phase Ga2−x Snx O3 thin films, determined from the absorption spectrum, decreases linearly with increasing Sn content. A metal–semiconductor–metal structured solar-blind photodetector based α -phase Ga2−x Snx O3 thin films was fabricated, and excellent solar-blind ultraviolet characteristics were demonstrated. The ratio of I254/ I dark was up to 1.40 × 102 and the responsivity increased to 9.55 × 10−2 A W−1. The results suggest that α -phase Ga2−x Snx O3 thin films are promising candidates for use in solar-blind photodetectors. (paper)
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Available from http://dx.doi.org/10.1088/0268-1242/31/6/065010; Country of input: International Atomic Energy Agency (IAEA)
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