[en] Full text: Ion microscopy is an exciting and emerging technology with a vast range of applications from materials characterization to nanostructuring. The talk will start off with an introduction to FIB/SEMs, which combine a gallium Focused Ion Beam (FIB) and a Scanning Electron Microscope (SEM). FIB/SEMs are a versatile tool for materials analysis and nanostructuring and are most commonly used to reveal internal sample structures at high resolution (cross-sectioning), to reconstruct a 3D model of the sample via a slice and view process and to prepare TEM-lamellas (sections) or samples for Atom Probe Tomography at precisely selected points within the sample which cannot be achieved by other techniques. In addition, FIB/SEMs are commonly used to fabricate nanoporous arrays or plasmonic devices. The first part of the talk will conclude with a discussion about the ion solid interactions and the most commonly found process induced artefacts and ways to avoid them. The presentation will then focus on introducing the more recent Helium/Neon Ion Microscopy (HIM) which excels at high resolution surface imaging of conductive and non-conductive samples while outperforming the Focused Ion Beam (FIB) at sub 10nm structuring. (author)