Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.015 seconds
Borselli, M G; Eng, K; Ross, R S; Hazard, T M; Holabird, K S; Huang, B; Kiselev, A A; Deelman, P W; Warren, L D; Milosavljevic, I; Schmitz, A E; Sokolich, M; Gyure, M F; Hunter, A T, E-mail: mborselli@hrl.com2015
AbstractAbstract
[en] We report on a quantum dot device design that combines the low disorder properties of undoped SiGe heterostructure materials with an overlapping gate stack in which each electrostatic gate has a dominant and unique function—control of individual quantum dot occupancies and of lateral tunneling into and between dots. Control of the tunneling rate between a dot and an electron bath is demonstrated over more than nine orders of magnitude and independently confirmed by direct measurement within the bandwidth of our amplifiers. The inter-dot tunnel coupling at the charge configuration anti-crossing is directly measured to quantify the control of a single inter-dot tunnel barrier gate. A simple exponential dependence is sufficient to describe each of these tunneling processes as a function of the controlling gate voltage. (paper)
Primary Subject
Source
Available from http://dx.doi.org/10.1088/0957-4484/26/37/375202; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Nanotechnology (Print); ISSN 0957-4484;
; v. 26(37); [5 p.]

Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue