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Kim, Dong; Kim, Mirae; Kim, Kyung Chun, E-mail: kckim@pusan.ac.kr2017
AbstractAbstract
[en] In this study, we analyzed phosphorescence lifetime and its accuracy by growing frost for thermographic phosphor thermometry in a low-temperature environment. Mg4FGeO6:Mn particles were coated on an aluminum plate and excited with a UV-LED to obtain phosphorescence signals. The surface temperature was maintained at −20, −15, −10 °C, and the phosphorescence signal was acquired as the frost grew for 3700 s. The lifetime was calculated and compared with the calibration curve under no-frost conditions. The error of the measured lifetime was within 0.7% of that in the no-frost conditions. A 2D surface temperature profile of the target plate was successfully obtained with the frost formation. (paper)
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Available from http://dx.doi.org/10.1088/1361-6501/aa8894; Country of input: International Atomic Energy Agency (IAEA)
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