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Zhang, Hua; Zhou, Wenzhe; Liu, Qi; Yang, Zhixiong; Pan, Jiangling; Ouyang, Fangping; Xu, Hui, E-mail: ouyangfp06@tsinghua.org.cn, E-mail: cmpxhg@csu.edu.cn2017
AbstractAbstract
[en] Highlights: • Z-shaped MoS2 nanoribbon atomic-perfect-interface planar junctions are constructed. • The electronic transport mechanism of Z-shaped devices is theoretically clarified. • Bipolar transistors and Schottky barrier diodes with good performance. • Different scaling rules of on/off ratio as a function of the length and width of the channel. Based on MoS2 nanoribbons, metal-semiconductor-metal planar junction devices were constructed. The electronic and transport properties of the devices were studied by using density function theory (DFT) and nonequilibrium Green's functions (NEGF). It is found that a band gap about 0.4 eV occurs in the planar junction. The electron and hole transmissions of the devices are mainly contributed by the Mo atomic orbitals. The electron transport channel is located at the edge of armchair MoS2 nanoribbon, while the hole transport channel is delocalized in the channel region. The I-V curve of the two-probe device shows typical transport behavior of Schottky barrier, and the threshold voltage is of about 0.2 V. The field effect transistors (FET) based on the planar junction turn out to be good bipolar transistors, the maximum current on/off ratio can reach up to 1 × 104, and the subthreshold swing is 243 mV/dec. It is found that the off-state current is dependent on the length and width of the channel, while the on-state current is almost unaffected. The switching performance of the FET is improved with increasing the length of the channel, and shows oscillation behavior with the change of the channel width.
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S1386947717304897; Available from http://dx.doi.org/10.1016/j.physe.2017.06.004; Copyright (c) 2017 Published by Elsevier B.V.; Country of input: International Atomic Energy Agency (IAEA)
Record Type
Journal Article
Journal
Physica E. Low-Dimensional Systems and Nanostructures (Print); ISSN 1386-9477;
; v. 93; p. 143-147

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