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AbstractAbstract
[en] At the beginning of the 20. century, the discovery of the X-rays allowed to verify the theories expressed by crystallographers during the 18. century. X-rays diffraction allows characterizing polycrystalline materials of the cultural heritage as pigments, opacifiers in glasses, raw clays and metals. It gives quantitative information on the thickness of thin layers, the concentration of atoms in a solid solution, the texture. Several configurations are possible depending on the size and fragility of the artefacts: portable devices, laboratory facilities, in reflection or in transmission. Article published in 'Arqueometria - Estudios analiticos de materiales arqueologicos, Ediciones Instituto Frances de Estudios Andinos', Travaux de l'Institut Francais d'Etudes Andines 2018. (author)
[fr]
Au debut du XXe siecle, la decouverte des rayons X a permis de verifier les theories enoncees par les mineralogistes depuis le XVIIIe siecle sur la structure atomique des cristaux. La diffraction des rayons X permet de caracteriser les cristaux dans les materiaux du patrimoine comme les pigments, les opacifiants des verres, les argiles crues, les metaux. Elle donne des informations quantitatives sur l'epaisseur de couches minces, la concentration d'atomes dans une solution solide, la texture. Plusieurs configurations permettent de s'adapter aux dimensions et a la fragilite des oeuvres, qu'un prelevement soit envisageable ou non: appareils portables, diffractometres de laboratoire, en reflexion ou en transmission. Article publie dans 'Arqueometria - Estudios analiticos de materiales arqueológicos, Ediciones Instituto Frances de Estudios Andinos', Travaux de l'Institut Francais d'Etudes Andines 2018. (auteur)Original Title
Diffraction des rayons X appliquee au patrimoine
Primary Subject
Source
Feb 2018; 12 p; 20 refs.; Available from the INIS Liaison Officer for France, see the INIS website for current contact and E-mail addresses
Record Type
Miscellaneous
Report Number
Country of publication
CHEMICAL ANALYSIS, COHERENT SCATTERING, DIFFRACTION, DIFFRACTION METHODS, DISPERSIONS, ELECTRON TUBES, EQUIPMENT, HOMOGENEOUS MIXTURES, LI-DRIFTED DETECTORS, MEASURING INSTRUMENTS, MICROSTRUCTURE, MIXTURES, NONDESTRUCTIVE ANALYSIS, ORIENTATION, RADIATION DETECTORS, REFLECTION, SCATTERING, SEMICONDUCTOR DETECTORS, SI SEMICONDUCTOR DETECTORS, SIZE, SOLUTIONS, X-RAY EMISSION ANALYSIS, X-RAY EQUIPMENT
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