[en] We present the analysis of shot noise originating from a normal metal sandwiched between superconductor electrodes. The junction comprises of thin film of Aluminum (Al, T_C = 1.2 K) on which two closely spaced electrodes of tungsten (W, T_C=5.1 K) are deposited using an organo-metallic precursor of W in a focused ion beam system. The tungsten electrodes were placed at gap of 160 and 320 nm. Estimation of shot noise was done from the measured current voltage characteristics at different temperatures. A clear indication of the additional noise originating from the Cooper pair conversion and recombination happening at the interface has been observed in the analysis. (author)