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AbstractAbstract
[en] Any system sent to space is submitted to many constraints (radiations, temperature) which may lead to a failure of the whole system. In a close future, these constraints will become more and more critical as the space agencies are developing missions aiming at others planets such as Jupiter for which the radiative constraint is extremely harsh. In this work, two types of radiation effects are studied: the cumulative effects and the transient effects. One corresponds to the radiation-induced degradation over time, while the other corresponds to a punctual event that can happen at any time when the system is in space. To ensure a proper functioning of a system sent to space, qualifications standards for electronic components have been developed by different space agencies. All of these standards specify that the components must be tested for cumulative and transient effects, using pristine components for each test. Therefore, cumulative effects are treated separately from transient effects, while there is a significant probability that they will appear simultaneously during a space mission. The study of the synergistic effects is then the main frame of this thesis. On a bipolar operational amplifier, the output response of the component due to a transient event is directly related to the internal parameters of the component, which vary over time once in space. Through a comparison between three different operational amplifier sharing the same reference, the impact of the design over the degradation is explained. Lately, some unexpected failures were reported for which the failure mode seemed to indicate that an Electrostatic Discharge (ESD) protection structure was involved. Therefore, to understand if those protections may cause some unexpected failures, the degradation of gate grounded n-MOSFET (GGnMOS) will be investigated next. (author)
[fr]
Tout composant envoye dans l'espace est soumis a de nombreuses contraintes (radiations, temperature) qui peuvent conduire a une defaillance de l'ensemble du systeme. Dans un avenir proche, ces contraintes deviendront de plus en plus critiques a mesure que les agences spatiales developperont des missions visant d'autres planetes, telles que Jupiter, pour lesquelles la contrainte radiative est extreme. Dans ce travail, deux types d'effets dus aux radiations sont etudies: les effets cumulatifs et les effets transitoires. L'un correspond a la degradation induite par les radiations au cours du temps, tandis que l'autre correspond a un evenement ponctuel qui peut se produire a tout moment lorsque le systeme est dans l'espace. Pour garantir le bon fonctionnement en vol, des normes de qualification des composants electroniques ont ete elaborees par differentes agences spatiales. Toutes ces normes precisent que les effets cumulatifs et transitoires doivent etre verifies a l'aide de composants intacts pour chaque essai. Par consequent, les effets cumulatifs sont traites separement des effets transitoires, alors qu'il y a une forte probabilite qu'ils apparaissent simultanement pendant une mission spatiale. L'etude des effets de synergie est alors le theme principal de cette these. Sur un amplificateur operationnel bipolaire, la reponse de sortie du composant due a un evenement transitoire est directement liee aux parametres internes du composant, qui varient sous l'effet des radiations. A l'aide d'une comparaison entre trois amplificateurs operationnels differents partageant la meme reference, l'impact du design sur la degradation due aux radiations est etudie. Recemment, des defaillances imprevues ont ete reportees pour lesquelles le mode de defaillance semblait indiquer qu'une structure de protection contre les decharges electrostatiques (ESD) etait en cause. Par consequent, pour comprendre si ces protections peuvent causer des defaillances inattendues, la degradation des 'Gate Grounded n-MOSFET' (GGnMOS) est egalement etudiee. (auteur)Original Title
Etude des effets de synergie dans les circuits integres soumis a l'environnement spatial de rayonnements ionisants et neutres
Primary Subject
Source
27 Nov 2018; 182 p; 186 refs.; Available from the INIS Liaison Officer for France, see the INIS website for current contact and E-mail addresses; These Docteur de l'Universite de Montpellier en electronique - Composants et Systemes
Record Type
Miscellaneous
Literature Type
Thesis/Dissertation
Report Number
Country of publication
ATOMIC DISPLACEMENTS, COMPUTERIZED SIMULATION, CUMULATIVE RADIATION EFFECTS, ELECTRIC DISCHARGES, ELECTRIC POTENTIAL, ELECTRON TRANSFER, ELECTROSTATICS, INTEGRATED CIRCUITS, LEAKAGE CURRENT, MESH GENERATION, MOSFET, OPERATIONAL AMPLIFIERS, PERFORMANCE, RADIATION HARDNESS, SEMICONDUCTOR DIODES, SENSITIVITY ANALYSIS, THYRISTORS, TRANSIENTS
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