Filters
Results 1 - 1 of 1
Results 1 - 1 of 1.
Search took: 0.017 seconds
AbstractAbstract
[en] A capacitance probe apparatus is described which was used to detect the deflection occurring during ion implantation of thin specimens of annealed steel. The deflection is related to the introduction of a surface compressive stress. 100-keV argon ion implantation is found to produce surface stresses of several thousand lbs/in.2 which reach a maximum at a dose approximately 5.0 x 1016 ions-cm-2. Light ions, such as nitrogen, which form chemically stable compounds within the steel, generate similar stresses within the surface such that a macroscopic deflection of the specimen can be observed. In this case very high doses are required to maximize the stress (approximately 1017 ions-cm-2 Results are interpreted with reference to damage mechanisms and nitride formation, and are discussed in relation to the mechanical property changes previously reported. (U.S.)
Original Title
100-keV Ar+; 200-keV N2+
Primary Subject
Record Type
Journal Article
Journal
Journal of Vacuum Science and Technology; v. 12(1); p. 485-489
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue