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AbstractAbstract
[en] A Materials Analysis Company (MAC) Model 450 microprobe has been modified in the field to equip it with a greatly improved beam scanning system and certain other mechanical improvements. The scanning system provides a good backscattered electron detection system and functions for quick and accurate positioning of the beam for spot analyses. Electrical connections for sample current and backscattered electron signals have been improved for more positive contact and less tendency to damage. Specimen rotation has been made much more positive and reliable by devised changes
Primary Subject
Source
Gray, R.J. (ed.); p. 75-90; 1974; American Elsevier Publishing Company, Inc; New York; 5. annual technical conference of the IMS Analysis Society; Chicago, Illinois, USA; 19 Sep 1972
Record Type
Book
Literature Type
Conference
Country of publication
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