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AbstractAbstract
[en] Measurements of the submillimeter cyclotron resonance of electrons and holes in electric subbands on [0,0,0,1] and [1,1,0,0) tellurium surfaces are presented. As insulating layer in the applied MIS arrangement a Hostaphan foil of 6.3 μm thickness and a dielectric constant of epsilon=3.2epsilon0 was used. To separate the weak surface resonance from the strong bulk cyclotron resonance lines of the substrate, both square wave and harmonic modulation of the electric field was used and the surface signal was detected by phase sensitive amplification. The experiments were performed with a continuous wave HCN molecular gas laser spectrometer. The magnetic field was applied parallel or perpendicular to the trigonal c-axis of the samples, which were shaped as non-plane parallel slabs. Simultaneously to the optical transmission the magneto resistance of the samples was investigated and provided the necessary information to distinguish in the optical resonance spectra between occupation effects as predicted by Ando and the splitting of the cyclotron resonance due to different mass parameters. (Auth.)
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Journal Article
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Surface Science; v. 58(1); p. 202-206
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