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AbstractAbstract
[en] Characteristics of spark mass spectrometers (ion source, properties of the ion beam, ion optics, and performance) and their use in qualitative and quantitative analysis are described. This technique is very interesting for the semi-quantitative analysis of trace amounts, down to 10-8 atoms. Examples of applications such as the analysis of high purity materials and non-conducting mineral samples, and determination of carbon and gas trace amounts are presented. (50 references)
[fr]
On decrit les caracteristiques des spectrometres de masse a etincelles (source d'ions, propriete du faisceau d'ions, optique ionique, et performance) et leur utilisation en analyse qualitative et quantitative. Cette technique est interessante pour l'analyse semi-quantitative de traces jusqu'au niveau de 10-8 en atome. On presente quelques exemples d'application: analyse de materiaux de haute purete et d'echantillons mineraux non conducteurs, dosage de traces de carbone et de gaz. (50 references)Original Title
Analyse des traces par spectrometrie de masse a etincelles
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Source
Cornu, Aime (ed.); p. 321-355; ISBN 2706100516;
; 1975; Presses Universitaires; Grenoble, France

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