[en] Electron irradiation damages in Cu and Cu alloys were used to study: sink efficiency of dislocations for point defects; enhanced nucleation of the dislocation loops on the active slip planes
Jouffrey, Bernard; Favard, Pierre (eds.); p. 233-236; 1976; Societe Francaise de Microscopie Electronique; Paris; 4. International congress on high voltage electron microscopy; Toulouse, France; 1 Sep 1975