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Krausse, G.J.; Gram, P.A.M.
Los Alamos Scientific Lab., N.Mex. (USA)1978
Los Alamos Scientific Lab., N.Mex. (USA)1978
AbstractAbstract
[en] A system used to monitor secondary beam profiles at the LAMPF Linac for channel tune-up and diagnostics is described. The multiwire proportional chamber design is discussed, and descriptions and drawings of the gate card, the amplifier/multiplexer card, the output amplifier card, and the overall system are given
Original Title
4 drawings (separate from report)
Primary Subject
Secondary Subject
Source
May 1978; 53 p; Available from NTIS., PC A04/MF A01
Record Type
Report
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Reference NumberReference Number
INIS VolumeINIS Volume
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