AbstractAbstract
[en] Auger electron spectroscopy (A.E.S.) allows to characterize the atoms lying at surfaces of amorphous and crystalline materials and to investigate their chemical bond. In the case of single crystals it is generally associated with LEED which gives information on the surface structure. After having recalled some principles about radiationless deexcitation of atoms and the related Auger transitions, the problems of interpretation of energy spectra in the case of a single atom and their of an atom bound to neighbours either of the same kind or of a different one, are discussed. Some applications of A.E.S. as an analytical method are finally described
[fr]
La spectrometrie des electrons Auger permet de caracteriser les atomes situes a la surface d'un corps cristallin ou amorphe et de preciser la nature de leurs liaisons. Dans le cas de monocristaux elle est en general associee a la diffraction des electrons lents, ce qui permet d'avoir, en plus des renseignements sur la structure de la surface. Apres un rappel de la desexcitation non radiative des atomes et des transitions Auger correspondantes, les problemes que souleve l'interpretation des spectres d'energie sont traites d'abord dans le cas d'un atome isole puis dans celui d'un atome lie a des atomes voisins de meme espece ou d'especes differentes. On examine enfin quelques applications de l'analyse AugerOriginal Title
Spectrometrie des electrons Auger
Source
Colloquium on recent methods for solids analysis; Dijon, France; 30 Jun 1975
Record Type
Journal Article
Literature Type
Conference
Journal
Revue de Physique Appliquee; v. 11(1); p. 13-21
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Burggraf, C.; Goldsztaub, S.
Study of crystalline transformations at high temperatures above 2000K1972
Study of crystalline transformations at high temperatures above 2000K1972
AbstractAbstract
No abstract available
Original Title
Diffracteur d'electrons pour l'etude de substances a tres haute temperature
Primary Subject
Source
Centre National de la Recherche Scientifique, 75 - Paris (France); Colloques Internationaux du Centre National de la Recherche Scientifique; (no.205); p. 95-96; 1972; Centre National de la Recherche Scientifique; Paris, France; International colloquium on the study of crystalline transformations at high temperatures above 2000K; Odeillo, France; 27 Sep 1971
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Book
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Conference
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AbstractAbstract
[en] X-ray photoelectron spectroscopy (XPS) and Rutherford backscattering spectroscopy (RBS) are used to investigate the temperature effect on Gd/Cu and Dy/Cu interfaces. In the case of Gd/Cu, both RBS and XPS analysis indicate alloys formation for an annealing temperature range of 200-600 C. In the case of Dy/Cu, XPS results suggest alloy formation at about 500 C which is not observed by RBS. In both cases, the two methods indicate oxidation of the films above 600 C. In-depth concentration profiles are discussed. (orig.)
Primary Subject
Source
12. international conference on the application of accelerators in research and industry; Denton, TX (United States); 2-5 Nov 1992
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms; ISSN 0168-583X;
; CODEN NIMBEU; v. 79(1-4); p. 450-453

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