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AbstractAbstract
[en] The performance of a new monochromator using holographically-ruled toroidal blank gratings has been evaluated at the Tantalus-I synchrotron radiation facility. Two gratings, optimized for 80-320 Angstroem and 320-1280 Angstroem respectively, are mounted on a common scan axis and can be exchanged with a flip mechanism. The monochromator is characterized by high flux from 10-150 eV and by its simplicity of operation. Measurements of photon flux, resolution, and polarization are summarized. (orig.)
Source
National conference on synchrotron radiation instrumentation; Gaithersburg, MD; 4 - 6 Jun 1979
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods; ISSN 0029-554X;
; v. 172(1/2); p. 133-135

Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Dunham, D; Soukiassian, P.; Denlinger, J.D.; Tonner, B.P.; Rotenberg, E.
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1998
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1998
AbstractAbstract
No abstract available
Source
LBNL/ALS--43882; AC03-76SF00098; Journal Publication Date: 1998
Record Type
Journal Article
Journal
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Banerjee, S.; Ravy, S.; Denlinger, J.D.; Chen, X.; Tonner, B.P.
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1997
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1997
AbstractAbstract
No abstract available
Source
LBNL/ALS--29599; AC03-76SF00098; Journal Publication Date: January 1997
Record Type
Journal Article
Journal
Surface Review and Letters; ISSN 0218-625X;
; v. 4(6); [10 p.]

Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Dunham, D.; Mehlberg, S.; Chamberlin, S.; Soukiassian, P.; Denlinger, J.D.; Rotenberg, E.; Tonner, B.P.; Hurych, Z.D.
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States). Funding organisation: USDOE Director. Office of Science. Office of Basic Energy Sciences (United States)2003
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States). Funding organisation: USDOE Director. Office of Science. Office of Basic Energy Sciences (United States)2003
AbstractAbstract
[en] Investigation of the initial oxidation and interface formation of cubic silicon carbide for the silicon rich β-SiC(100) 3?2 surface reconstruction by high resolution synchrotron radiation-based soft x-ray photoemission spectroscopy is described. The surface is exposed to low doses of molecular oxygen ranging from 1 up to 10 000 L, at surface temperatures from 25 to 500 deg C. Significant formation of SiO2 is found for the surface at room temperature, with the rate of oxidation increasing with temperature. Valence band data and Si 2p core level spectra show that even at low exposures, significant oxidation is taking place, with a surface reactivity to oxygen much larger than for silicon surfaces. The oxidation products, which are grown at very low temperatures (≤ 500 oC) include SiO2 as a dominant feature but also substoichiometric oxides Si+1, Si+2, Si+3, and significant amounts of mixed oxide products involving C atoms (Si-O-C)
Secondary Subject
Source
LBNL--55615; AC03-76SF00098; Journal Publication Date: 08/05/2003
Record Type
Journal Article
Journal
Journal of Vacuum Science and Technology. B, Microelectronics and Nanometer Structures Processing, Measurement and Phenomena; ISSN 1071-1023;
; v. 21(4); [10 p.]

Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Omori, S.; Nihei, Y.; Rotenberg, E.; Denlinger, J.D.; Kevan, S.D.; Tonner, B.P.; Van Hove, M.A.; Fadley, C.S.
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States). Funding organisation: USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (United States)2000
Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (United States). Funding organisation: USDOE Director, Office of Science. Office of Basic Energy Studies. Division of Materials Sciences (United States)2000
AbstractAbstract
No abstract available
Primary Subject
Source
LBNL--47048; AC03-76SF00098; Available from Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US); Journal Publication Date: February 4, 2002
Record Type
Journal Article
Journal
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] As a spectroscope technique, x-ray absorption near-edge structure (XANES) of core-levels using synchrotron radiation is a wide-spread use for the determination of the molecular composition of solid surfaces. A common detection method measures the yield of secondary electrons, which is proportional to the x-ray absorption coefficient for sufficiently high photon energy. In the experiments reported here, the authors show how the secondary electrons emitted as a result of photoabsorption can be used to generate a magnified image of the sample surface, with fundamental spatial limits determined by the deBroglie wavelength of the emitted electrons. Contrast in the secondary electron spatial distribution contains both typographical and chemical information about the sample surface. The use of tunable synchrotron radiation enables separation of these contributions to the microscopic image, and to spatially resolve surface chemical composition
Primary Subject
Secondary Subject
Source
Clark, R; Gland, J. (Michigan Univ., Ann Arbor, MI (USA)); Weaver, J.H. (Minnesota Univ., Minneapolis, MN (USA)); Materials Research Society symposium proceedings. Volume 143; 304 p; ISBN 1-55899-016-X;
; 1989; p. 279-284; Materials Research Society; Pittsburgh, PA (USA); Synchrotron radiation in materials research; Boston, MA (USA); 28-30 Nov 1988; CONF-8811224--; Materials Research Society, 9800 Mc Knight Rd., Suite 327, Pittsburgh, PA 15237 (USA)

Record Type
Book
Literature Type
Conference
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] The performance of a monochromator using holographic-ruled toroidal gratings has been evaluated at the Tantalus-I Synchrotron Radiation Center. The initial design criteria are given, and the flux in the 10-150 eV photon energy range is compared with other UV monochromators. Measurements of photon flux, resolution and polarization are reported. (orig.)
Source
Japanese/USA seminar on synchrotron radiation facilities; Honolulu, HI, USA; 5 - 9 Nov 1979
Record Type
Journal Article
Literature Type
Conference
Journal
Nuclear Instruments and Methods; ISSN 0029-554X;
; v. 177(1); p. 153-156

Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
AbstractAbstract
[en] Microscopy and x-ray emission analysis have been performed on Y--Ba--Cu--O superconductors as a function of temperature using a scanning electron microscope equipped with a low-temperature stage. The samples exhibit a superconducting phase transition above liquid nitrogen temperature as determined by resistivity measurements and a demonstrated Meissner effect. Strong contrast changes in the micrographs due to the superconducting phase transition are found, which have been used to identify normal and superconducting regions of the sample. These samples are found to consist of particles with superconducting shells surrounding a nonsuperconducting core
Primary Subject
Secondary Subject
Record Type
Journal Article
Journal
Country of publication
ALKALINE EARTH METAL COMPOUNDS, BARIUM COMPOUNDS, CHALCOGENIDES, CHEMICAL ANALYSIS, COPPER COMPOUNDS, ELECTRIC CONDUCTIVITY, ELECTRICAL PROPERTIES, ELECTRON MICROSCOPY, MICROSCOPY, NONDESTRUCTIVE ANALYSIS, OXIDES, OXYGEN COMPOUNDS, PHYSICAL PROPERTIES, THERMODYNAMIC PROPERTIES, TRANSITION ELEMENT COMPOUNDS, YTTRIUM COMPOUNDS
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Rotenberg, E.; Kevan, S.D.; Denlinger, J.D.; Tonner, B.P.
Applications of synchrotron radiation techniques to materials science II1995
Applications of synchrotron radiation techniques to materials science II1995
AbstractAbstract
[en] Experimental surface core-level shifts (SCLSs) aid in understanding the roles of altered electronic and screening properties at reconstructed semiconductor surfaces. Because of unresolved theoretical issues, the assignment of SCLSs has often remained controversial even though the surface geometry has been completely determined with traditional probes. Angular- and energy-dependent x-ray photoelectron diffraction (XPD) of each chemically resolved surface core-level electron can be used to discriminate the structure around each chemically shifted species. However, this technique requires tunability, high energy resolution to separate the SCLSs from the bulk core-levels, and high photon flux in order to gather large amounts of data in a reasonable time. Using the newly commissioned spectromicroscopy beamline 7.0 at the Advanced Light Source, the authors have acquired chemically-resolved XPD data for Si(111) 7x7 for several photon energies, and by examination of forward-focusing peaks they can draw tentative conclusions about the atomic origins of each core-level shifted peak
Primary Subject
Secondary Subject
Source
Terminello, L.J. (ed.) (Lawrence Livermore National Lab., CA (United States)); Shinn, N.D. (ed.) (Sandia National Labs., Albuquerque, NM (United States)); Ice, G.E. (ed.) (Oak Ridge National Lab., TN (United States)); D'Amico, K.L. (ed.) (X-ray Analytics, Ltd., Hinsdale, IL (United States)); Perry, D.L. (ed.) (Lawrence Berkeley Lab., CA (United States)); Materials Research Society symposium proceedings, Volume 375; 349 p; ISBN 1-55899-277-4;
; 1995; p. 145-150; Materials Research Society; Pittsburgh, PA (United States); 1994 fall meeting of the Materials Research Society (MRS); Boston, MA (United States); 28 Nov - 2 Dec 1994; Materials Research Society, 9800 McKnight Road, Pittsburgh, PA 15237 (United States) Order No. 375, $69.00

Record Type
Book
Literature Type
Conference; Numerical Data
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
Denlinger, J.D.; Rotenberg, E.; Warwick, T.; Visser, G.; Nordgren, J.; Guo, J.-H.; Skytt, P.; Kevan, S.D.; McCutcheon, K.S.; Shuh, David K.; Bucher, J.; Edelstein, Norman M.; Tobin, J.G.; Tonner, B.P.
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1995
Ernest Orlando Lawrence Berkeley National Lab., Advanced Light Source, Berkeley, CA (United States). Funding organisation: US Department of Energy (United States)1995
AbstractAbstract
No abstract available
Primary Subject
Source
LBL--36713; LBNL/ALS--73; AC03-76SF00098; Journal Publication Date: February 1995
Record Type
Journal Article
Journal
Country of publication
Reference NumberReference Number
INIS VolumeINIS Volume
INIS IssueINIS Issue
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