Methods for measuring dose and beam profiles of processing electron accelerators
AbstractAbstract
[en] Practical methods for measuring dose and beam profiles of processing electron accelerators are presented and discussed on the basis of dosimetric methods using the CTA film dosimeter and the electron current densitometer. In electron beam dosimetry, film dosimeters are the most effective means of directly obtaining information on dose profiles in irradiated material, but they are not very effective in obtaining information on the radiation field such as electric charge and energy fluence, intensity and their change with time. Measurement of electron current density provides such information. The paper is chiefly concerned with the application of both measurement systems for various purposes in electron radiation processing studies. A readout system for the CTA dosimeter providing a hollow cathode lamp which emits monochromatic light was developed for precise and simple measurement. This system simplifies the procedure of obtaining depth-dose and lateral dose profiles by automatic traces along the CTA tape. A double-scanning microspectrometer was also designed and used on a trial basis to measure two-dimensional dose distributions with the CTA dosimeter and other plastic or dye-plastic dosimeters. The apparatus allows local distributions of dose and beam intensity in small areas to be obtained, as well as dose maps in relatively large areas to ensure dose uniformity. Electron current densitometers are widely applied for measurements of quantities associated with the radiation field, dose evalution in the absorber, calibration of dosimeters and time monitoring of electron charge fluence and electron current density in order to obtain accurate dose dependence and various dosimetric characteristics. The influence of ionic charge is described as the main source of uncertainty or error in determining electron current density. Limitation in applications of the CTA dosimeter and the electron current densitometer to an electron energy lower than 500 keV is also discussed. (author)
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Source
International Atomic Energy Agency, Vienna (Austria); Proceedings series; 449 p; ISBN 92-0-010085-6;
; 1985; p. 317-331; IAEA; Vienna (Austria); International symposium on high-dose dosimetry; Vienna (Austria); 8-12 Oct 1984; IAEA-SM--272/18

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