Published May 1974
| Version v1
Report
Application of Auger electron spectroscopy to electron probe microanalysis
Description
no abstract available
Availability note (English)
Available from ZAED.Additional details
Additional titles
- Original title (German)
- Ueber die Anwendung der Auger-Elektronenspektroskopie bei der Elektronenstrahlmikroanalyse
Publishing Information
- Imprint Title
- Basic research in the field of scanning electron-microscopy. P. 1.
- Imprint Pagination
- 41 p.
- Report number
- BMFT-FB-T--74-09(1)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 6183413
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Is Lead record
- Yes
- Descriptors DEI
- AUGER EFFECT; ELECTRIC CURRENTS; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON GUNS; ELECTRON MICROSCOPY; ELECTRON PROBES; ELECTRON SCANNING; ELECTRON SPECTROSCOPY; ELECTRONIC CIRCUITS; ENERGY SPECTRA; EV RANGE; MICROANALYSIS; SPECTROMETERS
- Descriptors DEC
- BEAMS; CURRENTS; EMISSION; ENERGY RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; MICROSCOPY; PARTICLE BEAMS; PROBES; SPECTRA; SPECTROSCOPY
Optional Information
- Notes
- 22 figs.; 3 tabs.; 17 refs. Imprint:Available from ZLDI (Zentralstelle fuer Luft- und Raumfahrtdokumentation und -information).;Grundlagenforschung auf dem Gebiet Elektronen-Rastermikroskopie. T. 1.