Published May 1974 | Version v1
Report Metadata-only

On the scanning electron-microscopy of thin specimens in transmission

Creators

  • 1. Siemens A.G., Karlsruhe (F.R. Germany). Messtechnische Entwicklung

Description

no abstract available

Availability note (English)

Available from ZAED.
Part of:
Application of Auger electron spectroscopy to electron probe microanalysis

Additional details

Additional titles

Original title (German)
Ueber die Raster-Elektronenmikroskopie an durchstrahlbaren Praeparaten

Publishing Information

Imprint Title
Basic research in the field of scanning electron-microscopy. P. 2.
Imprint Pagination
18 p.
Report number
BMFT-FB-T--74-09(2)

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
6186113
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
CATHODES; ELECTRON BEAMS; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRON SCANNING; ELECTRON SPECTROSCOPY; ENERGY SPECTRA; FIELD EMISSION; KEV RANGE 10-100; OXYGEN; PLASMONS; SAMPLE PREPARATION; SPECTROMETERS; TRANSMISSION
Descriptors DEC
BEAMS; ELECTRODES; ELEMENTS; EMISSION; ENERGY RANGE; KEV RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; MICROSCOPY; NONMETALS; PARTICLE BEAMS; QUASI PARTICLES; SPECTRA; SPECTROSCOPY

Optional Information

Notes
5 figs. Imprint:Available from ZLDI (Zentralstelle fuer Luft- und Raumfahrtdokumentation und -information).;Grundlagenforschung auf dem Gebiet Elektronen-Rastermikroskopie. T. 2.