Published 1996
| Version v1
Miscellaneous
Ellipsometric investigation of ion implanted GaAs
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of International Conference Polarimetry and Ellipsometry
- Imprint Pagination
- 106 p.
- Journal Page Range
- p. 60-61
Conference
- Title
- International Conference Polarimetry and Ellipsometry
- Dates
- 20-23 May 1996
- Place
- Kazimierz Dolny (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 30025365
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- DOPED MATERIALS; ELLIPSOMETRY; GALLIUM ARSENIDES; ION IMPLANTATION; MEETINGS; OPTICAL PROPERTIES; SPECTRAL REFLECTANCE; SURFACE PROPERTIES
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; GALLIUM COMPOUNDS; MATERIALS; MEASURING METHODS; OPTICAL PROPERTIES; PHYSICAL PROPERTIES; PNICTIDES
Optional Information
- Notes
- 9 refs