Published 1996 | Version v1
Miscellaneous Metadata-only

Abstracts of International Conference Polarimetry and Ellipsometry

Creators

Description

The conference gave a deep insight into scientific and engineering applications of polarimeters, ellipsometers and related instruments. The scientific sessions of P/E-metry conference included the following main topics: physics and analysis of polarized light; production and processing of polarized light; new polarimetric and ellipsometric instruments and devices; application of polarimetry and ellipsometry in studies of optical anisotropy, characterization of surfaces, measurements and control of thin films and layers, semiconductor technology and other areas of applied material science and technology

Availability note (English)

Available at Institute of Electronic Materials Technology, ul. Wolczynska 133, 01-910 Warsaw, Poland

Additional details

Publishing Information

Imprint Pagination
106 p.

Conference

Title
International Conference Polarimetry and Ellipsometry
Dates
20-23 May 1996
Place
Kazimierz Dolny (Poland)

INIS

Country of Publication
Poland
Country of Input or Organization
Poland
INIS RN
30025366
Subject category
S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Is Lead record
Yes
Descriptors DEI
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; LEADING ABSTRACT; MEETINGS; MICROELECTRONICS; NONLINEAR OPTICS; OPTICAL PROPERTIES; POLARIZATION; SEMICONDUCTOR MATERIALS; SPECTRAL REFLECTANCE; SURFACE PROPERTIES; THIN FILMS
Descriptors DEC
ABSTRACTS; CRYSTAL STRUCTURE; FILMS; MATERIALS; OPTICAL PROPERTIES; OPTICS; PHYSICAL PROPERTIES