Published 1995
| Version v1
Book
Trace elements determination in high purity germanium and lithium
Creators
- 1. Pakistan Inst. of Nuclear Science and Technology, Islamabad (Pakistan). Nuclear Physics Div.
Description
Neutron activation analysis was employed to the determination of 29 trace impurities in high-purity Al foils and semiconductor grade Ge. In order to determine very low contents of U and /sup 239/Th and /sup 233/Pa as activation products were separated by using anion exchange and LaF/sub 3/ coprecipitation method. The impurity contents found to be low in high-purity Al and even lower in semiconductor grade Ge. Therefore adverse effects would be negligible. Our data could partially be compared with the data reported in literature and found in good agreement. (author) 5 tabs; 10 refs
Additional details
Publishing Information
- Publisher
- Scientific Information Division, PINSTECH P.O. Nilore Islamabad Pakistan.
- Imprint Place
- Islamabad (Pakistan)
- Imprint Title
- Spectroscopy for material analysis
- Imprint Pagination
- 512 p.
- Journal Page Range
- p. 97-102.
Conference
- Title
- 2. National Symposium on Modern Trends in Contemporary Chemistry.
- Dates
- 4-6 Apr 1995.
- Place
- Islamabad (Pakistan).
INIS
- Country of Publication
- Pakistan
- Country of Input or Organization
- Pakistan
- INIS RN
- 27073907
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM; COMPARATIVE EVALUATIONS; GERMANIUM; IMPURITIES; NEUTRON ACTIVATION ANALYSIS; SAMPLE PREPARATION; SEMICONDUCTOR MATERIALS; THORIUM; TRACE AMOUNTS; URANIUM
- Descriptors DEC
- ACTINIDES; ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; ELEMENTS; EVALUATION; MATERIALS; METALS; NONDESTRUCTIVE ANALYSIS