Published 1998
| Version v1
Miscellaneous
Reciprocal space mapping and reflectivity investigations of the epi-ready InP substrate
Creators
- 1. Instytut Technologii Materialow Elektronicznych, Warsaw (Poland)
- 2. Institut fuer Ionenstrahlphysik und Materialforschung, Rossendorf (Germany)
Description
no abstract available
Additional details
Publishing Information
- Imprint Title
- Abstracts of 5. Polish Conference on Crystal Growth
- Imprint Pagination
- [100 p.]
- Journal Page Range
- p. P.III.21
Conference
- Title
- 5. Polish Conference on Crystal Growth
- Dates
- 10-13 May 1998
- Place
- Naleczow (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 31023404
- Subject category
- S36: MATERIALS SCIENCE; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- CRYSTAL DEFECTS; EPITAXY; INDIUM PHOSPHIDES; MAPPING; MEETINGS; REFLECTIVITY; SUPERLATTICES; SURFACE PROPERTIES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTAL STRUCTURE; DIFFRACTION; FILMS; INDIUM COMPOUNDS; OPTICAL PROPERTIES; PHOSPHIDES; PHOSPHORUS COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SCATTERING; SURFACE PROPERTIES