Published 1998
| Version v1
Miscellaneous
Characterization of polycrystalline thin layers by conventional x-ray diffraction
Creators
- 1. Dept. Cristallografia i Mineralogia, Universitat de Barcelona, Barcelona (Spain)
Description
no abstract available
Additional details
Additional titles
- Augmented title (English)
- thin films
Publishing Information
- Imprint Title
- Abstracts of 5. Polish Conference on Crystal Growth
- Imprint Pagination
- [100 p.]
- Journal Page Range
- p. I.18
Conference
- Title
- 5. Polish Conference on Crystal Growth
- Dates
- 10-13 May 1998
- Place
- Naleczow (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 31023364
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- No Abstract, Conference, Non-conventional Literature
- Descriptors DEI
- BARIUM COMPOUNDS; CHEMICAL VAPOR DEPOSITION; CUPRATES; EPITAXY; MEETINGS; POLYCRYSTALS; RESIDUAL STRESSES; TEXTURE; THIN FILMS; X-RAY DIFFRACTION; YTTRIUM COMPOUNDS
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHEMICAL COATING; COHERENT SCATTERING; COPPER COMPOUNDS; CRYSTAL GROWTH METHODS; CRYSTALS; DEPOSITION; DIFFRACTION; FILMS; OXYGEN COMPOUNDS; SCATTERING; STRESSES; SURFACE COATING; TRANSITION ELEMENT COMPOUNDS