Published 1993
| Version v1
Miscellaneous
Abstracts of 3rd conference and general meeting of Polish Society on Crystal Growth
Description
The chemical preparation and different methods of crystal growth especially by means of Czochralski method have been presented. The monocrystals of materials important for electronic as laser materials, semiconductors, semi-insulators and high-Tc superconductors have been prepared. Their optical and electric properties have been investigated in respect to crystal structure, existence and concentration of defects, doping elements etc. The substrate materials for epitaxy layers have been also prepared and its physical properties investigated. During the conference 22 lectures and 30 posters have been presented
Availability note (English)
Available from Institute of Electronic Materials Technology, 133, Wolczynska St., 01-919 Warsaw, Poland.Additional details
Publishing Information
- Publisher
- Inst.of Electronic Materials Techn. and Inst. of Physics - Polish Academy of Sciences.
- Imprint Place
- Warsaw (Poland)
- Imprint Pagination
- 67 p.
Conference
- Title
- 3. Conference and General Meeting of Polish Society on Crystal Growth.
- Dates
- 11-13 May 1993.
- Place
- Warsaw (Poland).
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 28022938
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Is Lead record
- Yes
- Descriptors DEI
- CHEMICAL PREPARATION; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CZOCHRALSKI METHOD; DOPED MATERIALS; ELECTRICAL PROPERTIES; ELECTRON SPIN RESONANCE; HIGH-TC SUPERCONDUCTORS; LASER MATERIALS; LEADING ABSTRACT; MEETINGS; MONOCRYSTALS; OPTICAL PROPERTIES; SEMICONDUCTOR MATERIALS; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ABSTRACTS; CHEMICAL ANALYSIS; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTALS; DIFFRACTION; MAGNETIC RESONANCE; MATERIALS; NONDESTRUCTIVE ANALYSIS; PHYSICAL PROPERTIES; RESONANCE; SCATTERING; SUPERCONDUCTORS; SYNTHESIS; X-RAY EMISSION ANALYSIS