Proceedings of the international conference on electron microscopy and allied techniques and thirty eighth annual meeting of the Electron Microscope Society of India

This conference since its inception aims to provide an indispensable research tool in the study of materials. The technique of electron microscopy has advanced beyond normal expectations. It is impossible to identify any one branch of materials science, which has not been influenced and improved by the application of electron microscopy, be it for mapping the structure and microstructure with high spatial resolution; or equivalently capturing the phase chemistry details on a localized scale. The topics covered are: bio-materials and nanotechnology for life sciences; atom-probetomography; industrial applications of electron microscopy; electron microscopy-in situ and operando techniques; electron microscopy of advanced engineering materials; high resolution including aberration-corrected microscopy; chemistry and spectroscopy techniques, macromolecular structure function; electron microscopy of earth sciences microscopy of fundamental materials; diffraction, crystallography and aperiodic structures; microscopy of low dimensional materials; defects and radiation damage etc. Papers relevant to INIS are indexed separately